Electronic measurements and instrumentation / (Record no. 15806)

MARC details
000 -LEADER
fixed length control field 10261nam a2200241Ia 4500
003 - CONTROL NUMBER IDENTIFIER
control field NULRC
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20250520102815.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 250520s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9788131721995
040 ## - CATALOGING SOURCE
Transcribing agency NULRC
050 ## - LIBRARY OF CONGRESS CALL NUMBER
Classification number TK 275 .K57 2010
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kishore, K. Lal.
Relator term author
245 #0 - TITLE STATEMENT
Title Electronic measurements and instrumentation /
Statement of responsibility, etc. K. Lal Kishore
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Place of publication, distribution, etc. Chennai, India :
Name of publisher, distributor, etc. Pearson, Dorling Kindersley,
Date of publication, distribution, etc. c2010
300 ## - PHYSICAL DESCRIPTION
Extent xxiv, 422 pages :
Other physical details illustrations ;
Dimensions 24 cm.
365 ## - TRADE PRICE
Price amount USD17.93
504 ## - BIBLIOGRAPHY, ETC. NOTE
Bibliography, etc. note Includes bibliographical references and index.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Cover -- Brief Contents -- Contents -- Foreword -- Preface -- Acknowledgements -- About the Author -- Chapter 1: Measurements and Instruments -- 1.1 Introduction -- 1.2 Terminology -- 1.2.1 Advantages of Instrumentation Systems -- 1.2.2 Block Schematics of Measuring Systems -- 1.2.3 Other Systems -- 1.2.4 Objectives of Measurement -- 1.2.5 Comparison between Analog and Digital Instruments -- 1.2.6 Factors for the Selection of Analog and Digital Equipments -- 1.3 Performance Characteristics -- 1.3.1 Definitions -- 1.4 Significant Figures -- 1.5 Dynamic Characteristics -- 1.6 Types of Errors -- 1.6.1 Gross Errors -- 1.6.2 Systematic Errors -- 1.6.3 Random Errors -- 1.7 Statistical Analysis -- 1.7.1 Probability of Errors and Gaussian Curve -- 1.8 Measurement Standards -- 1.9 Suspension Galvanometer -- 1.10 D'Arsonval Movement -- 1.10.1 Taut-Band Suspension -- 1.10.2 Temperature Compensation -- 1.10.3 Shunt Resistor -- 1.10.4 Ayrton Shunt -- 1.11 Direct Current Meters -- 1.12 D'Arsonval Meter Movement Used in DC Voltmeters -- 1.12.1 Ammeter Loading Effect -- 1.13 DC Voltmeters -- 1.13.1 Multirange Voltmeter -- 1.14 Ohmmeter -- 1.14.1 Series-Type Ohmmeter -- 1.14.2 Shunt-Type Ohmmeter -- 1.14.3 D'Arsonval Meter Movement Used in Ohmmeter -- 1.14.4 Multiple Range Ohmmeters -- 1.14.5 Electrolyte Capacitor Leakage Tests -- 1.14.6 For Non-Electrolyte Capacitors -- 1.15 Multimeter -- 1.16 Alternating Current-Indicating Instruments -- 1.16.1 Electrodynamometer -- 1.17 Rectifier-Type Instruments -- 1.18 Meter Protection -- 1.19 Extension of Range -- 1.20 Frequency Compensation -- 1.21 Electronic Voltmeter (for DC) -- 1.22 Electronic Voltmeter (for AC) -- 1.22.1 Average Reading Voltmeter -- 1.22.2 Peak Reading Voltmeter -- 1.22.3 Peak-To-Peak Detector -- 1.23 DC Meter with Amplifier -- 1.24 Chopper-Stabilised Amplifier -- 1.25 AC Voltmeter using Rectifiers. 1.26 True RMS-Responding Voltmeter -- 1.27 Balanced Bridge Voltmeter (VTVM) -- 1.27.1 Advantages -- 1.27.2 Disadvantages -- 1.28 Transistor Voltmeter (TVM) -- 1.29 Electronic Multimeter -- 1.29.1 Resistance Ranges -- 1.30 AC Current Measurement -- 1.30.1 Differential Voltmeter -- 1.31 Differential Amplifier -- 1.32 Alternating Current Instruments (AC Meters) -- 1.32.1 D'Arsonval Meter Movement for AC Circuit -- 1.32.2 Modified Circuit for AC Measurements -- 1.32.3 D'Arsonval Meter Movement Circuit (FWR) -- 1.33 Electrodynamometer Movement -- 1.33.1 Transfer Instruments -- 1.33.2 Iron Vane-Meter Movement -- 1.34 Thermocouple Meter -- 1.34.1 Constant Voltage Source -- 1.34.2 Constant Current Source -- 1.34.3 Volt Box -- 1.34.4 Factors to be Considered in the Selection of an Analog Voltmeter -- 1.35 Digital Voltmeters -- 1.35.1 General Specifications -- 1.36 Ramp-Type DVM -- 1.37 Staircase Ramp-Type DVM -- 1.38 Dual Slope Integrating-Type DVM -- 1.39 Successive-Approximation Conversion (SAC) -- 1.39.1 Block Schematic -- 1.40 Continuous Balance-Type DVM -- 1.41 Automatic Polarity Indication for DVM -- 1.42 Autoranging for DVM -- 1.42.1 Typical Case -- 1.43 3 3 4 Digit Display -- 1.44 Picoammeter -- 1.44.1 Applications -- 1.45 Low-Current Ammeter Applications -- 1.45.1 Wafer-Level Photodiode Testing -- 1.45.2 Monitoring and Control of Focused Ion Beam Currents -- 1.46 High-Resistance Measurements -- 1.47 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems -- Chapter 2: Waveform Generators -- 2.1 Introduction -- 2.2 Considerations in Choosing an Oscillator or Signal Generator -- 2.3 Sine Wave Generator -- 2.4 Oscillator Circuit -- 2.5 Attenuator -- 2.6 Frequency-Synthesised Signal Generator -- 2.7 Sweep-Frequency Generator -- 2.8 Pulse and Square Wave Generator -- 2.9 Function Generator. 2.10 Arbitrary Waveform Generator -- 2.10.1 Applications -- 2.11 Video Signal Generator -- 2.12 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems -- Chapter 3: Signal Analysers -- 3.1 Introduction -- 3.2 Wave Analyser -- 3.3 AF Wave Analyser -- 3.4 High-Frequency Wave Analyser -- 3.4.1 Frequency Mixers -- 3.5 Harmonic Distortion -- 3.5.1 Tunable Selective Circuit -- 3.5.2 Disadvantages -- 3.5.3 Heterodyne Wave Analyser (Wavemeter) -- 3.5.4 Fundamental Suppression Method of Distortion Measurement -- 3.6 Heterodyne Wave Analyser -- 3.6.1 Applications of Wave Analysers -- 3.7 Tuned Circuit Harmonic Analyser -- 3.8 Heterodyne Harmonic Analyser or Wavemeter -- 3.9 Fundamental Suppression Harmonic Distortion Analyser -- 3.10 Spectrum Analyser -- 3.10.1 Characteristics of a Spectrum Analyser -- 3.10.2 Applications of a Spectrum Analyser -- 3.10.3 Basic Spectrum Analyser -- 3.10.4 Factors to be Considered in a Spectrum Analyser -- 3.11 Low-Frequency Spectrum Analyser -- 3.11.1 Applications -- 3.12 Power Analyser -- 3.12.1 Communications Signal Analyser -- 3.12.2 Logic Analysers -- 3.12.3 Network Monitoring System -- 3.12.4 System Architecture -- 3.12.5 Features -- 3.12.6 Applications -- 3.13 Capacitance-Voltage Analysers -- 3.14 Oscillators -- 3.14.1 Considerations in Choosing an Oscillator -- 3.15 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems -- Chapter 4: Oscilloscopes -- 4.1 Introduction -- 4.2 Cathode Ray Oscilloscope -- 4.3 Block Diagram of a CRO -- 4.4 Cathode Ray Tube (CRT) -- 4.5 Graticules -- 4.6 Electrostatic Deflection Sensitivity -- 4.6.1 Design Criteria -- 4.7 Different Controls in a CRO -- 4.7.1 How to Operate a CRO -- 4.8 Time Base Generators -- 4.8.1 Time Base Circuits -- 4.9 Triggered Mode -- 4.9.1 Free-Running Mode. 4.9.2 Synchronisation of the Sweep Circuit -- 4.9.3 Types of CROS -- 4.9.4 Sections of CRTs -- 4.9.5 Deflection Sensitivity Equation -- 4.10 Neon Time Base Circuit -- 4.10.1 Frequency of Neon Time Base -- 4.10.2 Neon Lamp -- 4.10.3 Free-Running Mode of CRO -- 4.10.4 Using CRO in Triggered Mode -- 4.10.5 Automode of Sweep -- 4.10.6 Normal Mode -- 4.11 Time Base Circuit for a General-Purpose CRO -- 4.11.1 Synchronisation Issues -- 4.11.2 Line Synchronisation -- 4.12 Lissajous Figures -- 4.13 Types of CRO Probes -- 4.13.1 Direct Probe -- 4.13.2 High-Impedance Probe -- 4.13.3 Detector Probe -- 4.13.4 High-Voltage Probe -- 4.14 High-Frequency CRO Considerations -- 4.15 Delay Lines in CROs -- 4.15.1 Lumped Parameter Delay Line -- 4.15.2 Distributed Parameter Delay Line -- 4.16 Applications of CRO -- 4.17 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems -- Chapter 5: Special Types of CROs -- 5.1 Special Types of Oscilloscopes -- 5.2 Dual Beam CRO -- 5.3 Dual Trace CRO -- 5.4 Sampling Oscilloscope -- 5.4.1 Sampling Oscilloscopes -- Vertical and Time Base -- 5.4.2 Sampling Vertical -- 5.4.3 Sampling Time Base -- 5.5 Storage Oscilloscopes -- 5.5.1 Mesh Storage -- 5.5.2 Variable Persistence -- 5.5.3 Phosphor Storage -- 5.5.4 Phosphor Characteristics -- 5.5.5 Persistence of Phosphor Materials -- 5.5.6 CRO Subsystems -- 5.6 Digital Storage CRO -- 5.6.1 CRO Probes -- 5.7 Frequency/Period-Timer/Counter Circuit -- 5.8 Frequency Measurement -- 5.9 Period Measurement -- 5.9.1 Advantages -- 5.10 Errors in Frequency/Period Measurements -- 5.10.1 Errors Because of Crystal Stability -- 5.11 Universal Counters -- 5.12 Extending the Range of Frequency Counters -- 5.13 Glossary -- 5.14 The ABC's of Oscilloscopes -- 5.15 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems.
505 ## - FORMATTED CONTENTS NOTE
Formatted contents note Chapter 6: DC and AC Bridges -- 6.1 Introduction -- 6.2 DC Bridges -- 6.3 Wheatstone Bridge -- 6.3.1 Operation -- 6.3.2 Measurement Errors -- 6.3.3 Thevenin's Equivalent Circuit -- 6.4 Kelvin Bridge -- 6.4.1 Kelvin Double Bridge -- 6.4.2 Applications -- 6.5 Strain Gauge Bridge Circuit -- 6.6 AC Bridges -- 6.6.1 General Form of Bridge Circuit -- 6.7 Maxwell Bridge -- 6.7.1 Phasor Diagram for the Maxwell Bridge -- 6.8 Hay Bridge -- 6.8.1 Phasor Diagram for Hay Bridge -- 6.9 Schering Bridge -- 6.9.1 Phasor Diagram for a Schering Bridge -- 6.10 Wien Bridge -- 6.10.1 Phasor Diagram for the Wien Bridge -- 6.11 Anderson Bridge -- 6.12 Resonance Bridge -- 6.13 Similar Angle Bridge -- 6.14 Radio Frequency Bridge (Subtitution Technique) -- 6.15 Wagner's Ground Connection -- 6.16 Twin-T Null Network -- 6.17 Bridged-T Network -- 6.18 Detectors for AC Bridges -- 6.19 Phasor Diagrams -- 6.20 Recorders -- 6.20.1 Introduction -- 6.21 Strip-Chart Recorders -- 6.21.1 Galvanometric Recorders -- 6.21.2 Sensitivity -- 6.21.3 Transient Response -- 6.22 Pen-Driving Mechanism -- 6.23 Other Features -- 6.24 Servorecorders -- 6.25 Servobalancing Potentiometric Recorder -- 6.26 Characteristics of Typical Servorecorders -- 6.27 Oscillographic Recorders -- 6.28 Magnetic Tape Recorders -- 6.28.1 Direct AM Recording -- 6.28.2 Frequency Modulation Recording -- 6.29 Recorders (Contd.) -- 6.29.1 X-Y Recorders -- 6.29.2 Self-Balancing Potentiometers -- 6.29.3 Working of a Servotype Motor -- 6.29.4 Chopper -- 6.29.5 Servotype X-Y Recorders -- 6.29.6 Y-Scale -- 6.30 Galvonometer Oscillographs -- 6.30.1 Applications -- 6.31 Summary -- Points to Remember -- Objective-type Questions -- Review Questions -- Unsolved Problems -- Chapter 7: Transducers -- 7.1 Introduction -- 7.1.1 Examples -- 7.2 Classification of Transducers -- 7.3 Active and Passive Transducers.
520 ## - SUMMARY, ETC.
Summary, etc. Electronic Measurements and Instrumentation provides a comprehensive blend of the theoretical and practical aspects of electronic measurements and instrumentation. It provides a comprehensive coverage of each topic in the syllabus with a special fo.
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONIC INSTRUMENTS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Source of classification or shelving scheme Library of Congress Classification
Koha item type Books
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Withdrawn status Lost status Source of classification or shelving scheme Damaged status Not for loan Collection Home library Current library Shelving location Date acquired Source of acquisition Cost, normal purchase price Total checkouts Full call number Barcode Date last seen Copy number Price effective from Koha item type
    Library of Congress Classification     Electronics and Communications Engineering LRC - Main National University - Manila General Circulation 05/11/2017 Purchased - Amazon 17.93   GC TK 275 .K57 2010 c.2 NULIB000013565 05/20/2025 c.2 05/20/2025 Books