MARC details
| 000 -LEADER |
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| fixed length control field |
03899nam a2200229Ia 4500 |
| 003 - CONTROL NUMBER IDENTIFIER |
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| control field |
NULRC |
| 005 - DATE AND TIME OF LATEST TRANSACTION |
|---|
| control field |
20250520102739.0 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
250520s9999 xx 000 0 und d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
9780071830997 |
| 040 ## - CATALOGING SOURCE |
|---|
| Transcribing agency |
NULRC |
| 050 ## - LIBRARY OF CONGRESS CALL NUMBER |
|---|
| Classification number |
TK 7881.15 .S26 2014 |
| 100 ## - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Sandler, Steven S. |
| Relator term |
author |
| 245 #0 - TITLE STATEMENT |
|---|
| Title |
Power integrity : |
| Remainder of title |
Measuring, optimizing, and troubleshooting power parameters in electronics systems / |
| Statement of responsibility, etc. |
Steven M. Sandler |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York, NY : |
| Name of publisher, distributor, etc. |
McGraw Hill Education, |
| Date of publication, distribution, etc. |
c2014 |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xv, 335 pages : |
| Other physical details |
illustrations ; |
| Dimensions |
23.5 cm. |
| 365 ## - TRADE PRICE |
|---|
| Price amount |
USD82.46 |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes index. |
| 505 ## - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
1. Introduction -- What you will learn from this book -- Who will benefit from this book -- The general format of this book -- 2. Measurement philosophy -- Cause no damage -- Measure without influencing the measurement -- Validate the test setup and measurement limits -- Measure in the most efficient and direct way -- Document measurements thoroughly -- 3. Measurement fundamentals -- Sensitivity -- Noise floor -- Dynamic range -- Noise density -- Signal averaging -- Scaling -- Attenuators -- Preamplifiers -- Measurement domains -- Endnotes -- 4. Test instruments -- Frequency response analyzers and vector network analyzers -- Oscilloscopes -- Spectrum analyzers -- Signal generators -- Tdr/tdt s-parameter analyzers -- 5. Probes, injectors, and interconnects -- Voltage probes -- Endnotes -- 6. The distributed system -- Noise paths within a voltage regulator -- Control loop stability -- How poor stability propagates through the system -- Endnotes -- 7. Measuring impedance -- Selecting a measurement method -- Endnotes -- 8. Measuring stability -- Stability and why it matters -- Endnotes -- 9. Measuring psrr -- Measurement methods -- Modulating the input -- Choosing the measurement domain -- Endnotes -- 10. Reverse transfer and crosstalk -- Reverse transfer of various topologies -- Modulating the output current -- Measuring the input current -- Measuring the input voltage -- Indirect measurement -- Endnotes -- 11. Measuring step load response -- Generating the transient -- Measuring the response(s) -- Endnotes -- 12. Measuring ripple and noise -- Selecting a measurement method -- Connecting the equipment -- Choosing the equipment -- Averaging and filtering -- Endnotes -- 13. Measuring edges -- Relating bandwidth and rise time -- Sampling rate and interleaved sampling -- Interpolation -- Coaxial cables -- The criticality of the probe connection -- Printed circuit board issues -- Probes -- Endnotes -- 14. Troubleshooting with near-field probes -- The basics of emissions -- The near-field probes -- Probe and orientation -- The measurement instrument -- Spectrum gating -- Endnotes -- 15. High-frequency impedance measurement -- Time domain -- Calibration -- Reference plane -- Setting tdr pulse rise time -- Interpreting tdr measurements -- Estimating inductance and capacitance -- S-parameter measurements -- Endnotes. |
| 520 ## - SUMMARY, ETC. |
|---|
| Summary, etc. |
Proven techniques for generating high-fidelity measurements. Power Integrity: Measuring, Optimizing, and Troubleshooting Power Related Parameters in Electronics Systems provides field-tested techniques for producing high-fidelity measurements using the appropriate equipment. The book thoroughly discusses measurement guidelines, test instrument selection and use, connecting the equipment to the device being tested, and interpreting the acquired data. The latest electronics technologies and their impact on measurement are discussed. Detailed photographs, screenshots, schematics, and equations are included throughout this practical guide. Learn how to accurately measure: Impedance, Stability, Power supply rejection ratio (PSRR), Reverse transfer and crosstalk, Step load response, Ripple and noise, Edges, High-frequency impedance. |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electric power supplies to apparatus |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Source of classification or shelving scheme |
Library of Congress Classification |
| Koha item type |
Books |
